Tomu co pises nerozumiem . Vysledkom kompilacie su subory HEX (flash pamat MCU) a EEP (eeprom MCU). Obidva subory su urcene pre nasledny zapis do MCU. Pre overenie som zmeral 2200uF elyt a cas od zapnutia pristroja po zobrazenie vysledku nameranej hodnoty je 6 sekund (FW 1.06k). Dobu zobrazenia vysledku je mozne skratit opatovnym stlacenim tlacitka "test" a naslednym meranim dalsej suciastky.stan266 napísal:Dobrý den, dá se pracovat (upravit makefile a následně zkompilovat do "lidské" formy exe a eep) ve Windows a AVR studiu? Rádi bychom zkrátili dobu měření, u verze 1.07 je u elytu 470uF je 36 sec.(8 sec. vlastní měření, 28 sec. ukazování). U verze 1.05 trvá stejný cyklus pouze 22 sec. (8 plus 14 sec). Za případnou radu předem dík.
Pricinou dlhsich casov pri merani moze byt aj velkost hodnoty C1 - zmienka o tom je v dokumentacii (ttester_1.07k.pdf).
Konkretne:
Capacitor C1 at the AREF pin - Many designs use a 100nF capacitor at the AREF pin, like the design of Markus F. too. As long as the reference voltage of the ADC is never changed, this is a good solution. The software of the TransistorTester for the ATmega168/328 uses a automatic selection of the internal 1.1 V reference voltage of the ADC, if the input voltage is below 1V. With this solution a better resolution of the ADC can be reached for little input voltages. Unfortunately the switching from 5V to 1.1V reference is very slowly. A additional wait time of 10ms must be respected for this reason. With changing the capacity value to 1nF this wait time can be reduced signicant. I have not noticed any degration of measurement quality with this change. Even a removing of the capacitor has no signicant change of measurement results. If you prefer to leve the capacitor unchanged, you can remove the option NO AREF CAP in the Makfile to activate longer wait times in the program.